Title :
A new semiconductor voltage standard
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Art; Current density; Equations; Impurities; P-n junctions; Semiconductor diodes; Stability; Temperature dependence; Temperature distribution; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157541
