• DocumentCode
    2896005
  • Title

    Second-level NIST Randomness Tests for Improving Test Reliability

  • Author

    Pareschi, Fabio ; Rovatti, Riccardo ; Setti, Gianluca

  • Author_Institution
    ENDIF, Ferrara Univ.
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    1437
  • Lastpage
    1440
  • Abstract
    Testing random number generators (RNGs) is as important as designing them. The paper considers the NIST test suite SP 800-22 and shows that, as suggested by NIST itself, to reveal non-perfect generators a more in-depth analysis should be performed using the outcomes of the suite over many generated sequences. Testing these second-level statistics is not trivial and, relying on a proper model that takes into account the errors due to the approximations in the first level tests, a tuning of the parameters in the simplest cases was propose. The validity of this consideration is widely supported by experimental results on several RNG currently employed by major IT players, as well as a chaos-based RNG designed by authors.
  • Keywords
    logic testing; random number generation; NIST randomness tests; SP 800-22; chaos-based RNG; nonperfect generators; random number generators; second-level statistics; test reliability; Chaos; Error analysis; NIST; Performance analysis; Performance evaluation; Probability; Random number generation; Random sequences; Statistical analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378572
  • Filename
    4252919