DocumentCode :
2896005
Title :
Second-level NIST Randomness Tests for Improving Test Reliability
Author :
Pareschi, Fabio ; Rovatti, Riccardo ; Setti, Gianluca
Author_Institution :
ENDIF, Ferrara Univ.
fYear :
2007
fDate :
27-30 May 2007
Firstpage :
1437
Lastpage :
1440
Abstract :
Testing random number generators (RNGs) is as important as designing them. The paper considers the NIST test suite SP 800-22 and shows that, as suggested by NIST itself, to reveal non-perfect generators a more in-depth analysis should be performed using the outcomes of the suite over many generated sequences. Testing these second-level statistics is not trivial and, relying on a proper model that takes into account the errors due to the approximations in the first level tests, a tuning of the parameters in the simplest cases was propose. The validity of this consideration is widely supported by experimental results on several RNG currently employed by major IT players, as well as a chaos-based RNG designed by authors.
Keywords :
logic testing; random number generation; NIST randomness tests; SP 800-22; chaos-based RNG; nonperfect generators; random number generators; second-level statistics; test reliability; Chaos; Error analysis; NIST; Performance analysis; Performance evaluation; Probability; Random number generation; Random sequences; Statistical analysis; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
Type :
conf
DOI :
10.1109/ISCAS.2007.378572
Filename :
4252919
Link To Document :
بازگشت