DocumentCode
2896005
Title
Second-level NIST Randomness Tests for Improving Test Reliability
Author
Pareschi, Fabio ; Rovatti, Riccardo ; Setti, Gianluca
Author_Institution
ENDIF, Ferrara Univ.
fYear
2007
fDate
27-30 May 2007
Firstpage
1437
Lastpage
1440
Abstract
Testing random number generators (RNGs) is as important as designing them. The paper considers the NIST test suite SP 800-22 and shows that, as suggested by NIST itself, to reveal non-perfect generators a more in-depth analysis should be performed using the outcomes of the suite over many generated sequences. Testing these second-level statistics is not trivial and, relying on a proper model that takes into account the errors due to the approximations in the first level tests, a tuning of the parameters in the simplest cases was propose. The validity of this consideration is widely supported by experimental results on several RNG currently employed by major IT players, as well as a chaos-based RNG designed by authors.
Keywords
logic testing; random number generation; NIST randomness tests; SP 800-22; chaos-based RNG; nonperfect generators; random number generators; second-level statistics; test reliability; Chaos; Error analysis; NIST; Performance analysis; Performance evaluation; Probability; Random number generation; Random sequences; Statistical analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location
New Orleans, LA
Print_ISBN
1-4244-0920-9
Electronic_ISBN
1-4244-0921-7
Type
conf
DOI
10.1109/ISCAS.2007.378572
Filename
4252919
Link To Document