• DocumentCode
    2896038
  • Title

    Built-In Self-Repair Techniques for Heterogeneous Memory Cores

  • Author

    Wang, Zhen-Yu ; Tsai, Yi-Ming ; Lu, Shyue-Kung

  • Author_Institution
    Dept. of Electron. Eng., Fu-Jen Catholic Univ., Taipei, Taiwan
  • fYear
    2009
  • fDate
    16-18 Nov. 2009
  • Firstpage
    69
  • Lastpage
    74
  • Abstract
    In this paper, BISR (built-in self-repair) techniques for heterogeneous multiple memory cores with divided redundancy mechanism are proposed. Redundant memories are partitioned into row blocks and column blocks and shared among all memory cores in the same memory group. Therefore, unlike the traditional redundancy mechanism, a row (column) block is used as the basic replacement element. Based on the proposed divided redundancy mechanism, a heuristic heterogeneous extended spare pivoting (HESP) redundancy analysis algorithm suitable for built-in implementation is also proposed. Experimental results show that repair rates can be improved significantly due to the efficient usage of redundancy. Moreover, the area overhead of the BISR circuitry for an example with four memory instances is only 1.12%.
  • Keywords
    DRAM chips; built-in self test; BISR; built-in implementation; built-in self-repair techniques; column blocks; divided redundancy mechanism; heterogeneous memory cores; heuristic heterogeneous extended spare pivoting; redundancy analysis algorithm; row blocks; Algorithm design and analysis; Built-in self-test; Circuit faults; Fault detection; Hardware; Information analysis; Random access memory; Redundancy; Semiconductor device manufacture; Testing; BISR; Reliability; Yield; memory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2009. PRDC '09. 15th IEEE Pacific Rim International Symposium on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-0-7695-3849-5
  • Type

    conf

  • DOI
    10.1109/PRDC.2009.19
  • Filename
    5368218