Title :
Towards structured log analysis
Author :
Jayathilake, Dileepa
Author_Institution :
99X Res., 99X Technol., Colombo, Sri Lanka
fDate :
May 30 2012-June 1 2012
Abstract :
Value of software log file analysis has been constantly increasing with the value of information to organizations. Log management tools still have a lot to deliver in order to empower their customers with the true strength of log information. In addition to the traditional uses such as testing software functional conformance, troubleshooting and performance benchmarking, log analysis has proven its capabilities in fields like intrusion detection and compliance evaluation. This is verified by the emphasis on log analysis in regulations like PCI DSS, FISMA, HIPAA and frameworks such as ISO 27001 and COBIT. In this paper we present an in depth analysis into current log analysis domains and common problems. A practical guide to the use of few popular log analysis tools is also included. Lack of proper support for structured analysis is identified as one major flaw in existing tools. After that, we describe a framework we developed for structured log analysis with the view of providing a solution to open problems in the domain. The core strength of the framework is its ability to handle many log file formats that are not well served by existing tools and providing sophisticated infrastructure for automating recurring log analysis procedures. We prove the usefulness of the framework with a simple experiment.
Keywords :
system monitoring; COBIT; FISMA; HIPAA; ISO 27001; PCI DSS; compliance evaluation; intrusion detection; log information; log management tools; recurring log analysis procedure automation; software log file analysis; structured log analysis; Data mining; Databases; Engines; Monitoring; Organizations; Software; Standards; log analysis; log data extraction; log management; mind map; structured logs;
Conference_Titel :
Computer Science and Software Engineering (JCSSE), 2012 International Joint Conference on
Conference_Location :
Bangkok
Print_ISBN :
978-1-4673-1920-1
DOI :
10.1109/JCSSE.2012.6261962