DocumentCode :
2896064
Title :
The Measurement of Optical and Dielectric Properties of Materials
Author :
Afsar, M.N.
Author_Institution :
Tufts University
fYear :
1988
fDate :
7-10 June 1988
Firstpage :
139
Lastpage :
140
Abstract :
This paper reviews optical and dielectric measurement techniques developed over approximateiy seventeen years in the frequency range one MHz to 18,000 GHz. It is necessary to employ varieties of measurement techniques to cover this extensive range of frequencies and to cope with material problems such as absorption characterisitics, size, thickness, shape and temperature of specimens.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location :
Ibaraki, Japan
Type :
conf
DOI :
10.1109/CPEM.1988.671220
Filename :
671220
Link To Document :
بازگشت