DocumentCode :
2896070
Title :
A flip-chip-packaged 1.8V 28dBm class-AB power amplifier with shielded concentric transformers in 32nm SoC CMOS
Author :
Tan, Yulin ; Xu, Hongtao ; El-Tanani, Mohammed A. ; Taylor, Stewart ; Lakdawala, Hasnain
Author_Institution :
Intel, Hillsboro, OR, USA
fYear :
2011
fDate :
20-24 Feb. 2011
Firstpage :
426
Lastpage :
428
Abstract :
As CMOS technology continues to scale for SoC applications, significant challenges to implement a monolithic linear high-power amplifier have emerged. This results from the low breakdown voltage of transistors, high on-chip passive loss on a conductive substrate, stringent bump-pattern constraints and thermal dissipation requirements of flip-chip packages. Most fully-integrated linear CMOS PAs reported to date were either fabricated on a relatively mature process (65nm or above) in a wire-bonded die with relatively high supply voltage (3.3V), or exhibited low power efficiency when backed-off. In many cases, digital pre-distortion was implemented to improve linearity and efficiency. We present a 1.8V single-chip CMOS PA with 21dBm average output power and 16% PAE while meeting -25dB EVM for 64-QAM OFDM signal without digital pre-distortion linearization in 32nm SoC CMOS on a flip-chip package. This per formance is enabled by: 1) On-chip shielded concentric transformers with power-splitting/combining structures to fit the design within the bump pattern constraint and thermal dissipation requirement of an SoC flip-chip package and to enhance power handling capability; 2) Minimum phase distortion by opti mized inter-stage power matching allowed by the high fmax of the minimum channel-length device.
Keywords :
CMOS analogue integrated circuits; OFDM modulation; electric breakdown; flip-chip devices; integrated circuit packaging; lead bonding; power amplifiers; power transistors; quadrature amplitude modulation; system-on-chip; transformers; QAM OFDM signal; SoC CMOS technology; class-AB power amplifier; conductive substrate; digital pre-distortion linearization; flip-chip-package; interstage power matching; minimum phase distortion; minimum-channel-length device; monolithic linear high-power amplifier; on-chip passive loss; power handling capability; power-splitting-combining structure; shielded concentric transformer; size 32 nm; size 65 nm; stringent bump-pattern constraint; thermal dissipation; transistor breakdown voltage; voltage 1.8 V; voltage 3.3 V; wire-bonded die; CMOS integrated circuits; Current measurement; OFDM; Power amplifiers; Power generation; System-on-a-chip; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-61284-303-2
Type :
conf
DOI :
10.1109/ISSCC.2011.5746381
Filename :
5746381
Link To Document :
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