DocumentCode
2896071
Title
Measurement Of The Complex Permittivity Of Microwave Materials With A Submillimeter Waveguide Four-Port Reflectometer
Author
Stumper, U.
Author_Institution
Physikalisch-Technische Bundesanstalt
fYear
1988
fDate
7-10 June 1988
Firstpage
141
Lastpage
142
Abstract
A new four-port reflectometer for the determination of the complex relative permittivity of microwave materials at submillimeter wavelengths is described. Measurement results obtained with various low-loss solids at frequencies of about 380 GHz agree well with data taken from the literature or obtained as results of an international comparison measurement exercise.
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location
Ibaraki, Japan
Type
conf
DOI
10.1109/CPEM.1988.671221
Filename
671221
Link To Document