Measurement Of The Complex Permittivity Of Microwave Materials With A Submillimeter Waveguide Four-Port Reflectometer

A new four-port reflectometer for the determination of the complex relative permittivity of microwave materials at submillimeter wavelengths is described. Measurement results obtained with various low-loss solids at frequencies of about 380 GHz agree well with data taken from the literature or obtained as results of an international comparison measurement exercise.