Title :
Information redundancy and adaptive structures
Author_Institution :
Stanford University, Stanford, CA, USA
Keywords :
Circuits; Decoding; Digital systems; Error correction; Error probability; Laboratories; Microelectronics; Redundancy; Solids; Voting;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157550
