DocumentCode :
2896192
Title :
Precise Measurement Method for Complex Permittivity of Microwave Dielectric Substrate
Author :
Nishikawa, T. ; Wakino, K. ; Tanaka, H. ; Ishikawa, Y.
Author_Institution :
Murata Manufacturing Company Limited
fYear :
1988
fDate :
7-10 June 1988
Firstpage :
155
Lastpage :
156
Abstract :
A new technique for the measurement of the complex permittivity of dielectrie substrates using a dielectric resonator is reported. This method is a non-contact measurement using two dielectric resonators which support TE mode. This paper describes some examples of measurements.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location :
Ibaraki, Japan
Type :
conf
DOI :
10.1109/CPEM.1988.671228
Filename :
671228
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2896192
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