Title :
Noise factors and fallacies
Author :
Engelbrecht, Rainer
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Keywords :
Circuit noise; Equations; Frequency; Laboratories; Noise figure; Noise generators; Optical noise; Telephony; Temperature; Transducers;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1964 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1964.1157561
