• DocumentCode
    2896375
  • Title

    Experimental approaches for the beam dynamics study in the PC RF gun at the PAL

  • Author

    Park, Jangho ; Park, Sung-Ju ; Kim, Changbum ; Parc, Yong-Woon ; Huang, Jung Yun ; Ko, In Soo ; Xiang, Dao

  • Author_Institution
    Brookhaven Nat. Lab., Upton
  • fYear
    2007
  • fDate
    25-29 June 2007
  • Firstpage
    1070
  • Lastpage
    1072
  • Abstract
    A high-brightness electron beam is emitted from a photo-cathode (PC) RF gun for use in the FIR (Far Infrared) facility being built at the Pohang Accelerator Laboratory (PAL). The beam dynamics study for the PAL XFEL injector is essential to generate low emittance electron beam from the PC RF gun. The XFEL injector requires 1 nC beam with short bunch length and low emittance. These conditions are simulated with PARMELA code and then are realized on experimental conditions. The experimental conditions for the XFEL injector are measured with beam diagnostic devices such as ICT and Faraday cup for charge measurement, a spectrometer for beam energy measurement. In this article, we present the experimental approaches of the beam dynamics study for the XFEL injector.
  • Keywords
    accelerator RF systems; charge measurement; electron beams; electron sources; particle beam bunching; particle beam diagnostics; particle beam dynamics; particle beam injection; photocathodes; FIR facility; Far Infrared facility; Faraday cup; ICT; PAL XFEL injector; PARMELA code; Pohang Accelerator Laboratory; X-ray free electron laser; beam diagnostic devices; beam dynamics simulations; beam energy measurement; bunch length; charge measurement; low emittance electron beam; photocathode RF gun; Cathodes; Charge measurement; Electron accelerators; Electron beams; Energy measurement; Free electron lasers; Laboratories; Laser beams; Radio frequency; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 2007. PAC. IEEE
  • Conference_Location
    Albuquerque, NM
  • Print_ISBN
    978-1-4244-0916-7
  • Type

    conf

  • DOI
    10.1109/PAC.2007.4440985
  • Filename
    4440985