DocumentCode :
2896446
Title :
A 4.6GHz MDLL with −46dBc reference spur and aperture position tuning
Author :
Ali, Tamer A. ; Hafez, Amr A. ; Drost, Robert ; Ho, Ronald ; Yang, Chih-Kong Ken
Author_Institution :
Univ. of California, Los Angeles, CA, USA
fYear :
2011
fDate :
20-24 Feb. 2011
Firstpage :
466
Lastpage :
468
Abstract :
Multiplying delay-locked loops (MDLLs) have been shown to have improved jitter accumulation and tracking over VCO-based PLLs. By injecting the reference clock edge into the VCO at each reference cycle, an MDLL removes the accumulated jitter of the VCO. The principal challenge in MDLL design is to align the injected reference edge with the loop feedback signal. Timing mismatch between the reference edge and the VCO feedback edge, or offsets in the charge pump, would introduce a phase error in the injected edge. The error manifests as a period jitter or reference spur in the frequency domain. This effect limits the minimum jitter attained by the MDLL. In previously published techniques, a select logic block generates an SEL pulse to briefly open an aperture for reference injection. A necessary attribute of the SEL pulse is that it is sufficiently sharp and well-positioned to select the next reference edge. However, at high frequencies, the position of the SEL pulse impacts the delay of the MUX and hence introduces pattern jitter and spurs. This paper minimizes the spur by introducing a calibrated phase delay to properly position the SEL pulse with respect to the reference edge, and by minimizing the inherent error of the charge pump.
Keywords :
charge pump circuits; circuit feedback; circuit noise; circuit tuning; delay lock loops; jitter; phase locked loops; voltage-controlled oscillators; MDLL design; SEL pulse; VCO feedback edge; VCO-based PLL; aperture position tuning; calibrated phase delay; charge pump; frequency 4.6 GHz; frequency domain; jitter accumulation; logic block; loop feedback signal; multiplying delay-locked loop; period jitter; phase error; reference clock edge; reference cycle; reference spur; timing mismatch; Apertures; Charge pumps; Clocks; Delay; Jitter; Tuning; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-61284-303-2
Type :
conf
DOI :
10.1109/ISSCC.2011.5746400
Filename :
5746400
Link To Document :
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