DocumentCode :
2896680
Title :
Parallel Architecture for High Throughput DFA-Based Deep Packet Inspection
Author :
Jiang, Junchen ; Wang, Xiaofei ; He, Keqiang ; Liu, Bin
Author_Institution :
Dept. of Comput. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear :
2010
fDate :
23-27 May 2010
Firstpage :
1
Lastpage :
5
Abstract :
Multi-pattern matching is a key technique for implementing network security applications such as Network Intrusion Detection/Protection Systems (NIDS/NIPSes) where every packet is inspected against predefined attack signatures written in regular expressions (regexes). To this end, Deterministic Finite Automaton (DFA) is widely used for multi-regex matching, but existing DFA-based researches have claimed high throughput at an expenses of extremely high memory cost. In this paper, we propose a parallel architecture of DFA called Parallel DFA (PDFA), using multiple flow aggregations to increase the throughput with nearly no extra memory cost. The basic idea is to selectively store the DFA in multiple memory modules which can be accessed in parallel and to explore the potential parallelism. The memory cost of our system in both the average cases and the worst cases is analyzed, optimized and evaluated by numerical results. The evaluation shows that we obtain an average speedup of about 0.5k to 0.7k where k is the number of parallel memory modules under our synthetic trace and compressed real trace in a statistical average case, compared with the traditional DFA-based matching approaches.
Keywords :
deterministic automata; finite automata; parallel architectures; pattern matching; security of data; statistical analysis; deep packet inspection; deterministic finite automaton; multipattern matching; multiple flow aggregations; multiregex matching; network intrusion detection; network protection systems; network security applications; parallel DFA; parallel architecture; parallel memory modules; predefined attack signatures; regular expressions; statistical average case; Automata; Costs; Doped fiber amplifiers; Hardware; Inspection; Intrusion detection; Laboratories; Paper technology; Parallel architectures; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications (ICC), 2010 IEEE International Conference on
Conference_Location :
Cape Town
ISSN :
1550-3607
Print_ISBN :
978-1-4244-6402-9
Type :
conf
DOI :
10.1109/ICC.2010.5501748
Filename :
5501748
Link To Document :
بازگشت