Title :
A 40nm 2Gb 7Gb/s/pin GDDR5 SDRAM with a programmable DQ ordering crosstalk equalizer and adjustable clock-tracking BW
Author :
Bae, Seung-Jun ; Sohn, Young-Soo ; Oh, Tae-Young ; Kim, Si-Hong ; Yang, Yun-Seok ; Kim, Dae-Hyun ; Kwak, Sang-Hyup ; Seol, Ho-Seok ; Shin, Chang-Ho ; Park, Min-Sang ; Han, Gong-Heom ; Kim, Byeong-Cheol ; Cho, Yong-Ki ; Kim, Hye-Ran ; Doo, Su-Yeon ; Kim, Y
Author_Institution :
Samsung Electron., Hwasung, South Korea
Abstract :
Most DRAM interfaces such as GDDR5 and DDR3 use parallel single-ended signaling due to pin-count restriction and backward compatibility. Notwithstanding poor signal and power integrity issues, GDDR5 speed reached beyond 5Gb/s in recent years by utilizing data bus inversion, error-detection coding, data training and channel equalization. However, channel crosstalk is becoming a major barrier to further speed improvement. A common solution for channel crosstalk reduction at the system level is to use a shielding line or wide spacing between signal lines, but increasing the number of layers in a chip package and PCB increase system cost. To remove the shielding lines and increase speed, this paper presents a channel crosstalk equalizer with programmable signal ordering capability for the DRAM transmitter. In addition, this paper addresses tri-mode clocking to reduce the system jitter for better timing margin: PLL off, LC-PLL and injection-locked oscillator.
Keywords :
DRAM chips; clocks; equalisers; phase locked loops; printed circuits; DRAM transmitter; GDDR5 SDRAM; LC-PLL; PCB; PLL off; adjustable clock-tracking BW; channel crosstalk; channel equalization; chip package; data bus inversion; data training; error-detection coding; injection-locked oscillator; memory size 2 GByte; programmable DQ ordering crosstalk equalizer; size 40 nm; system jitter reduction; tri-mode clocking; Clocks; Crosstalk; Driver circuits; Equalizers; Jitter; Phase locked loops; Random access memory;
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-61284-303-2
DOI :
10.1109/ISSCC.2011.5746414