Title :
Invited: The MOS transistor
Author_Institution :
Princeton University, Princeton, NJ, USA
Keywords :
Conductivity; Diodes; Electrodes; Electrons; Insulation; MOSFETs; Ohmic contacts; Resistors; Silicon; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157580
