DocumentCode :
2896714
Title :
A 58nm 1.8V 1Gb PRAM with 6.4MB/s program BW
Author :
Chung, Hoeju ; Jeong, Byung Hoon ; Min, ByungJun ; Choi, Youngdon ; Cho, Beak-Hyung ; Shin, Junho ; Kim, Jinyoung ; Sunwoo, Jung ; Park, Joon-min ; Wang, Qi ; Lee, Yong-Jun ; Cha, Sooho ; Kwon, DukMin ; Kim, Sangtae ; Kim, Sunghoon ; Rho, Yoohwan ; Park,
Author_Institution :
Samsung Electron., Hwasung, South Korea
fYear :
2011
fDate :
20-24 Feb. 2011
Firstpage :
500
Lastpage :
502
Abstract :
In mobile systems, the demand for the energy saving continues to require a low power memory sub-system. During the last decade, the floating-gate flash mem ory has been an indispensable low power memory solution. However, NOR flash memory has begun to show difficulties in scaling due to the device´s reliability and yield issues. Over the past few years, phase-change random access memory (PRAM) has emerged as an alternative non-volatile memory (NVM) owing to its promising scalability and low cost process. In this paper, a PRAM, implemented in a 58 nm PRAM process with a low power double-data-rate non volatile memory (LPDDR2-N) interface, is presented.
Keywords :
flash memories; integrated circuit reliability; low-power electronics; random-access storage; NOR flash memory; PRAM process; bit rate 6.4 Mbit/s; device reliability; energy saving; floating-gate flash memory; low power double-data-rate nonvolatile memory; low power memory subsystem; mobile systems; phase-change random access memory; size 58 nm; storage capacity 1 Gbit; voltage 1.8 V; Arrays; Bandwidth; Delay; Phase change random access memory; Programming; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2011 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-61284-303-2
Type :
conf
DOI :
10.1109/ISSCC.2011.5746415
Filename :
5746415
Link To Document :
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