• DocumentCode
    2896791
  • Title

    A low overhead fault tolerant FPGA with new connection box

  • Author

    Wong, Fujie ; Ha, Yajun

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
  • fYear
    2008
  • fDate
    8-10 Sept. 2008
  • Firstpage
    643
  • Lastpage
    646
  • Abstract
    With the increasing process variations in advanced semiconductor technologies, fault tolerance has become one of several essential issues in building Field Programmable Gate Arrays (FPGAs). Unfortunately, there has been much less fault tolerance work previously done on FPGA interconnects, which take up to 90% of an FPGA device, than on its logic blocks. In view of this, we develop a low overhead connection block architecture, which improves the fault tolerance of FPGA interconnects. By testing 10 MCNC benchmarks on the new architecture, FPGA fault tolerance reaches levels comparable to adding 2 extra wire tracks per channel, with the average timing overhead below 2.5% and the area overheads of only 2.5% - 4%.
  • Keywords
    fault tolerance; field programmable gate arrays; integrated circuit interconnections; connection box; low overhead fault tolerant FPGA; Benchmark testing; Buildings; Fault tolerance; Field programmable gate arrays; Lead compounds; Logic devices; Programmable logic arrays; Switches; Timing; Wires; FPGA; connection block; fault tolerance; interconnect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
  • Conference_Location
    Heidelberg
  • Print_ISBN
    978-1-4244-1960-9
  • Electronic_ISBN
    978-1-4244-1961-6
  • Type

    conf

  • DOI
    10.1109/FPL.2008.4630029
  • Filename
    4630029