DocumentCode
2896791
Title
A low overhead fault tolerant FPGA with new connection box
Author
Wong, Fujie ; Ha, Yajun
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore
fYear
2008
fDate
8-10 Sept. 2008
Firstpage
643
Lastpage
646
Abstract
With the increasing process variations in advanced semiconductor technologies, fault tolerance has become one of several essential issues in building Field Programmable Gate Arrays (FPGAs). Unfortunately, there has been much less fault tolerance work previously done on FPGA interconnects, which take up to 90% of an FPGA device, than on its logic blocks. In view of this, we develop a low overhead connection block architecture, which improves the fault tolerance of FPGA interconnects. By testing 10 MCNC benchmarks on the new architecture, FPGA fault tolerance reaches levels comparable to adding 2 extra wire tracks per channel, with the average timing overhead below 2.5% and the area overheads of only 2.5% - 4%.
Keywords
fault tolerance; field programmable gate arrays; integrated circuit interconnections; connection box; low overhead fault tolerant FPGA; Benchmark testing; Buildings; Fault tolerance; Field programmable gate arrays; Lead compounds; Logic devices; Programmable logic arrays; Switches; Timing; Wires; FPGA; connection block; fault tolerance; interconnect;
fLanguage
English
Publisher
ieee
Conference_Titel
Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
Conference_Location
Heidelberg
Print_ISBN
978-1-4244-1960-9
Electronic_ISBN
978-1-4244-1961-6
Type
conf
DOI
10.1109/FPL.2008.4630029
Filename
4630029
Link To Document