Title :
Approaches to critical problems of ultrahigh speed analog-to digital conversion
Author :
Hwang, Y. ; King, F. ; Schindler, H.
Author_Institution :
General Electric Electronics Laboratory, Sycracuse, NY, USA
Keywords :
Analog-digital conversion; Bandwidth; Circuit noise; Detectors; Equations; Light emitting diodes; Noise shaping; Pulse generation; Sampling methods; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157589
