DocumentCode :
2897005
Title :
Scandate-added tungsten dispenser cathode fabrication for 220 GHz sheet beam traveling wave tube amplifier
Author :
Jinfeng Zhao ; Gamzina, Diana ; Baig, Adeel ; Barnett, Larry ; Luhmann, Neville C. ; Na Li ; Ji Li
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California-Davis (UCD), Davis, CA, USA
fYear :
2012
fDate :
24-26 April 2012
Firstpage :
47
Lastpage :
48
Abstract :
Nanocomposite Sc2O3-added tungsten dispenser cathodes are being developed for a 220 GHz sheet beam TWT (SBTWT) and were tested in Cathode Life Test Vehicles (CLTV) with a Pierce gun configuration under CW mode. In CLTV #1, owing to a perveance issue (there is a 100 micron gap between the focus electrode and cathode emission surface), 10 A/cm2 dc current density can be achieved at practical temperature of 1120°Cbr for more than 2000 hours. In CLTV #2 with a reduced focus electrode gap (30 μm), 45 A/cm2 dc current density has been obtained. A collector pulsed current density of 56 A/cm2 at 960°Cbr at 4 kV, and up to 104 A/cm2 at 1040°Cbr was obtained in the CLTV #3 gun with a cathode out of 70 microns beyond electron focus. This CLTV is under CW life testing with 40 A/cm2 current density which is the design value for the 220 GHz SBTWT.
Keywords :
cathodes; current density; millimetre wave amplifiers; nanocomposites; scandium compounds; travelling wave amplifiers; travelling wave tubes; tungsten; CLTV #3 gun; CW mode; Pierce gun configuration; Sc2O3-W; cathode emission surface; cathode life test vehicles; collector pulsed current density; dc current density; electrode gap; focus electrode; frequency 220 GHz; nanocomposite; scandate-added tungsten dispenser cathode; sheet beam; temperature 1040 degC; temperature 1120 degC; temperature 960 degC; traveling wave tube amplifier; voltage 4 kV; Cathodes; Current density; Life testing; Powders; Tungsten; Vehicles; Sc2O3-added W; cathode life testing vehicles (CLTV); high current density;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
Type :
conf
DOI :
10.1109/IVEC.2012.6262068
Filename :
6262068
Link To Document :
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