Title :
High speed DTL logic
Author :
Fuschillo, N. ; Householder, D. ; Kroboth, J. ; Pardue, T.
Author_Institution :
Melpar, Inc., Falls Church, VA, USA
Keywords :
Flip-flops; Integrated circuit interconnections; Logic testing; MONOS devices; Metallization; Solid state circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157599
