• DocumentCode
    2897050
  • Title

    FPGA interconnect sizing using extended logical effort model

  • Author

    Yu, Haile

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong
  • fYear
    2008
  • fDate
    8-10 Sept. 2008
  • Firstpage
    695
  • Lastpage
    696
  • Abstract
    The proposed XLE model will enable us to calculate the delay of FPGA interconnect and determine closed form expressions for optimal transistor size, sensitivity and a minimal bound on delay. We will further extend it to cover process variations, resulting in a tool that can compare the statistical properties of different architectures. The models are simple and relatively technology independent and hence can be used to gain better intuition into the major causes of delay. Such a delay model can be used in optimization models and CAD tools as well as aid designers in developing new FPGA interconnect schemes.
  • Keywords
    CAD; field programmable gate arrays; integrated circuit interconnections; logic design; CAD tools; FPGA interconnect; XLE model; closed form expressions; optimization models; Circuit simulation; Delay; Design optimization; Driver circuits; Field programmable gate arrays; Integrated circuit interconnections; Inverters; Semiconductor device modeling; Statistical analysis; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
  • Conference_Location
    Heidelberg
  • Print_ISBN
    978-1-4244-1960-9
  • Electronic_ISBN
    978-1-4244-1961-6
  • Type

    conf

  • DOI
    10.1109/FPL.2008.4630042
  • Filename
    4630042