Title :
Combating process variation on FPGAS with a precise at-speed delay measurement method
Author :
Wong, Justin S J ; Cheung, Peter Y K ; Sedcole, Pete
Author_Institution :
Dept. of Electr. & Electron., Imperial Coll. London, London
Abstract :
The goal of this PhD project is to devise a way to combat the effect of process variation on propagation delays in modern FPGAs. Through our research, we have devised a novel measurement method that is capable of measuring the delays of components on FPGAs with picosecond timing resolution and fine spatial granularity. The method avoids the use of external test equipment and able to measure stochastic delay variability, which is becoming increasingly significant. The aim is to exhaustively test FPGA components based on this method and use the results to optimise the placement and routing of circuits in FPGAs to maximise performance under the negative influence of process variation.
Keywords :
field programmable gate arrays; FPGA; fine spatial granularity; picosecond timing resolution; process variation; propagation delays; speed delay measurement method; stochastic delay variability; Circuit testing; Clocks; Current measurement; Cyclones; Delay effects; Field programmable gate arrays; Frequency; Propagation delay; Stochastic processes; Timing;
Conference_Titel :
Field Programmable Logic and Applications, 2008. FPL 2008. International Conference on
Conference_Location :
Heidelberg
Print_ISBN :
978-1-4244-1960-9
Electronic_ISBN :
978-1-4244-1961-6
DOI :
10.1109/FPL.2008.4630046
