• DocumentCode
    2897208
  • Title

    A High-Speed High-Resolution Low-Distortion CMOS Bootstrapped Switch

  • Author

    Wang, Lei ; Ren, Junyan ; Yin, Wenjing ; Chen, Tingqian ; Xu, Jun

  • Author_Institution
    ASIC & Syst. State Key Lab., Fudan Univ., Shanghai
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    1721
  • Lastpage
    1724
  • Abstract
    This paper presents a low-voltage and low-distortion CMOS bootstrapped switch that adopts a new technique to improve the accuracy of sample-and-hold (S/H) circuits. In order to reduce distortion due to variation of the gate overdrive and the threshold voltage in conventional bootstrapped switches, a PMOS-type bootstrapped circuit combining with a NMOS-type one forms a double sampling switch that transmits input signals to the output terminal. The switch reduces the on-resistance greatly and keeps it constant, resulting in precise sampling of signals and better input bandwidth. A test S/H circuit based on this switch was designed and fabricated in SMIC 0.18-mum CMOS mixed signal technology. Experiments show at 100 MSample/s, a peak signal-to-noise-and-distortion ratio (SNDR) of 100.9 dB, spurious-free dynamic range (SFDR) of 102 dB and total harmonic distortion (THD) of 101 dB can be acquired, and for input frequency up to the Nyquist frequency, this circuit maintains SNDR over 90 dB, SFDR and THD better than 92.7 dB, respectively
  • Keywords
    CMOS integrated circuits; bootstrap circuits; low-power electronics; mixed analogue-digital integrated circuits; sample and hold circuits; signal sampling; 0.18 micron; CMOS bootstrapped switch; Nyquist frequency; SMIC CMOS mixed signal technology; double sampling switch; reduced distortion; sample-and-hold circuits; signal sampling; signal-to-noise-and-distortion ratio; spurious-free dynamic range; total harmonic distortion; Bandwidth; CMOS technology; Circuit testing; Distortion; Frequency; Sampling methods; Signal design; Switches; Switching circuits; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.377926
  • Filename
    4252990