DocumentCode
2897292
Title
Thermal emittance measurements from negative electron affinity photocathodes
Author
Bazarov, I.V. ; Dunham, B.M. ; Hannon, F. ; Li, Y. ; Liu, X. ; Miyajima, T. ; Ouzounov, D.G. ; Sinclair, C.K.
Author_Institution
Cornell Univ., Ithaca
fYear
2007
fDate
25-29 June 2007
Firstpage
1221
Lastpage
1223
Abstract
Recent computational optimizations have demonstrated that it should be possible to construct electron injectors based on photoemission cathodes in very high voltage DC electron guns in which the beam emittance is dominated by the thermal emittance from the cathode. Negative electron affinity (NEA) photocathodes are known to have a naturally low thermal emittance. However, the thermal emittance depends on the illuminating wavelength, the degree of negative affinity, and the band structure of the photocathode material. As part of the development of a high brightness, high average current photoemission electron gun for the injector of an ERL light source, we have measured the thermal emittance from negative affinity GaAs and GaAsP photo- cathodes. The measurements were made by obtaining the electron beam spot size downstream of a counter-wound solenoid lens as a function of the lens strength. Electron beam spot sizes were measured by two techniques: a 20 mum wire scanner, and a BeO screen. Excellent agreement in measured emittance has been obtained between these two methods and direct transverse phase space mapping using a 20 mum slit and the screen. Results are presented for both cathode types. The Cornell ERL injector performance is evaluated based on the results of these measurements.
Keywords
electron beams; electron guns; particle beam diagnostics; photocathodes; DC electron guns; ERL injector; ERL light source; counter-wound solenoid lens; electron beam spot size; electron injectors; negative electron affinity GaAs photocathodes; negative electron affinity GaAsP photocathodes; photoemission cathodes; thermal emittance measurements; Brightness; Cathodes; Electron beams; Electron emission; Electron guns; Lenses; Light sources; Photoelectricity; Size measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location
Albuquerque, NM
Print_ISBN
978-1-4244-0916-7
Type
conf
DOI
10.1109/PAC.2007.4441036
Filename
4441036
Link To Document