DocumentCode :
2897404
Title :
Coverage of a microarchitecture-level fault check regimen in a superscalar processor
Author :
Reddy, Virnal ; Rotenberg, Eric
Author_Institution :
Qualcomm Inc., San Diego, CA
fYear :
2008
fDate :
24-27 June 2008
Firstpage :
1
Lastpage :
10
Abstract :
Conventional processor fault tolerance based on time/space redundancy is robust but prohibitively expensive for commodity processors. This paper explores an unconventional approach to designing a cost-effective fault-tolerant superscalar processor. The idea is to engage a regimen of microarchitecture-level fault checks. A few simple microarchitecture-level fault checks can detect many arbitrary faults in large units, by observing microarchitecture-level behavior and anomalies in this behavior. Previously, we separately proposed checks for the fetch and decode stages, rename stage, and issue stage of a contemporary superscalar processor. While each piece hinted at the possibility of a complete regimen - for an overall fault-tolerant superscalar processor - this totality was not explored. This paper provides the culmination by building a full regimen into a superscalar processor. We show for the first time that the regimen-based approach provides substantial coverage of an entire superscalar processor. Analysis reveals vulnerable areas which should be the focus for regimen additions.
Keywords :
fault tolerant computing; microcomputers; fault-tolerant superscalar processor; microarchitecture-level fault check regimen; processor fault tolerance; Analytical models; Decoding; Electrical capacitance tomography; Fault detection; Fault tolerance; Fault tolerant systems; Microarchitecture; Pipelines; Redundancy; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks With FTCS and DCC, 2008. DSN 2008. IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2397-2
Electronic_ISBN :
978-1-4244-2398-9
Type :
conf
DOI :
10.1109/DSN.2008.4630065
Filename :
4630065
Link To Document :
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