DocumentCode :
2897472
Title :
Validation of hardware error recovery mechanisms for the SPARC64 V microprocessor
Author :
Ando, Hisashige ; Kan, Ryuji ; Tosaka, Yoshiharu ; Takahisa, Keiji ; Hatanaka, Kichiji
Author_Institution :
Fujitsu Ltd., Tokyo
fYear :
2008
fDate :
24-27 June 2008
Firstpage :
62
Lastpage :
69
Abstract :
The SPARC64 V microprocessor is designed for use in high-reliability, large-scale unix servers. In addition to implementing ECC for large SRAM arrays, the SPARC64 V microprocessor incorporates error detection and recovery mechanisms for processor logic circuits and smaller SRAM arrays. The effectiveness of these error recovery mechanisms was validated via accelerated neutron testing of Fujitsupsilas commercial unix server, the PRIMEPOWER 650. Soft errors generated in SRAM arrays were completely recovered by the implemented hardware mechanisms, and only 6.4% of the estimated neutron-induced logic circuit faults manifested as errors, 76% of which were recovered by hardware. From these tests, the soft error failure rate of the SPARC64 V microprocessor due to atmospheric neutron hits was confirmed to be well below 10 FIT.
Keywords :
fault tolerant computing; logic circuits; microprocessor chips; SPARC64 V microprocessor; SRAM arrays; error detection; hardware error recovery; neutron-induced logic circuit faults; processor logic circuits; unix servers; Circuit testing; Error correction codes; Hardware; Large-scale systems; Life estimation; Logic arrays; Logic circuits; Microprocessors; Neutrons; Random access memory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks With FTCS and DCC, 2008. DSN 2008. IEEE International Conference on
Conference_Location :
Anchorage, AK
Print_ISBN :
978-1-4244-2397-2
Electronic_ISBN :
978-1-4244-2398-9
Type :
conf
DOI :
10.1109/DSN.2008.4630071
Filename :
4630071
Link To Document :
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