Title :
An evaluation of the dielectric isolation technique for linear integrated circuits
Author :
Barrett, John ; Frescura, B.
Author_Institution :
Fairchild Semiconductor, Palo Alto, CA, USA
Keywords :
Analog integrated circuits; Broadband amplifiers; Conductivity; Dielectric measurements; Dielectric substrates; Leakage current; Parasitic capacitance; Radiofrequency amplifiers; Temperature; Thermal resistance;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157627
