• DocumentCode
    2897496
  • Title

    An evaluation of the dielectric isolation technique for linear integrated circuits

  • Author

    Barrett, John ; Frescura, B.

  • Author_Institution
    Fairchild Semiconductor, Palo Alto, CA, USA
  • Volume
    VIII
  • fYear
    1965
  • fDate
    17-19 Feb. 1965
  • Firstpage
    94
  • Lastpage
    95
  • Keywords
    Analog integrated circuits; Broadband amplifiers; Conductivity; Dielectric measurements; Dielectric substrates; Leakage current; Parasitic capacitance; Radiofrequency amplifiers; Temperature; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1965.1157627
  • Filename
    1157627
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2897496