Title :
The transient microwave impedance of PIN diodes
Author :
Johnston, Ron ; Ciccolella, D. ; De Loach, B.
Author_Institution :
Bell Telephone Laboratories, Inc., Murray Hill, NJ, USA
Keywords :
Circuit testing; Current measurement; Diodes; Impedance measurement; Microwave devices; Monitoring; Pulse measurements; Steady-state; Time measurement; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1965 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1965.1157634
