• DocumentCode
    2897639
  • Title

    Parameter estimation for systems with binary subsystems

  • Author

    Spall, James C.

  • Author_Institution
    Dept. of Appl. Math. & Stat., Appl. Phys. Lab., Johns Hopkins Univ., Baltimore, MD, USA
  • fYear
    2013
  • fDate
    17-19 June 2013
  • Firstpage
    83
  • Lastpage
    88
  • Abstract
    Consider a stochastic system of multiple subsystems, each subsystem having binary (“0 or 1”) output. The full system may have general binary or non-binary (e.g., Gaussian) output. Such systems are widely encountered in practice, and include engineering systems for reliability, communications and sensor networks, the collection of patients in a clinical trial, and Internet-based control systems. This paper considers the identification of parameters for such systems for general structural relationships between the subsystems and the full system. Maximum likelihood estimation (MLE) is used to estimate the mean output for the full system and the “success” probabilities for the subsystems. The MLE approach is well suited to providing asymptotic or finite-sample confidence bounds through the use of Fisher information or bootstrap Monte Carlo-based sampling. Three examples are presented to illustrate the method.
  • Keywords
    Monte Carlo methods; maximum likelihood estimation; probability; sampling methods; stochastic processes; Fisher information; Internet-based control system; MLE; asymptotic confidence bound; binary subsystem; bootstrap Monte Carlo-based sampling; clinical trial; communication network; engineering system; finite-sample confidence bound; general structural relationship; maximum likelihood estimation; mean output estimation; parameter estimation; sensor network; stochastic system; success probability; Computer network reliability; Convergence; Maximum likelihood estimation; Missiles; Optimization; Reliability; Vectors; System identification; complex systems; convergence analysis; maximum likelihood estimators; networks; reliability; uncertainty bounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2013
  • Conference_Location
    Washington, DC
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4799-0177-7
  • Type

    conf

  • DOI
    10.1109/ACC.2013.6579818
  • Filename
    6579818