DocumentCode :
2897681
Title :
Integration of the optical replica utrashort electron bunch diagnostics with the current-enhanced SASE in the LCLS
Author :
Ding, Y. ; Huang, Z. ; Emma, P.
Author_Institution :
SLAC, Menlo Park
fYear :
2007
fDate :
25-29 June 2007
Firstpage :
1293
Lastpage :
1295
Abstract :
In this paper, we present a feasibility study of integrating the optical replica (OR) ultrashort electron bunch diagnostics with the current-enhanced SASE (ESASE) scheme in the LCLS. Both techniques use an external laser to energy- modulate the electron beam in a short wiggler and then convert the energy modulation to a density modulation in a dispersive section. While ESASE proposes to use the high- current spikes to enhance the FEL signal, the OR technique extracts the coherent optical radiation produced by a density modulated electron beam for frequency resolved optical gating (FROG) diagnostics. We discuss the optimization studies of combining the OR method with the ESASE after the second bunch compressor in the LCLS. Simulation results show that the OR method is capable of reproducing the expected double-horn current profile of a 200-fs bunch. The possibilities and limitations of reconstructing the longitudinal phase space profile are also explored.
Keywords :
electron beams; free electron lasers; particle beam bunching; particle beam diagnostics; wigglers; FEL signal; coherent optical radiation; current-enhanced SASE scheme; density modulated electron beam; energy modulation; frequency resolved optical gating diagnostics; longitudinal phase space profile; optical replica ultrashort electron bunch diagnostics; wiggler; Dispersion; Electron beams; Electron optics; Energy resolution; Frequency; Integrated optics; Optical modulation; Optimization methods; Signal resolution; Undulators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2007. PAC. IEEE
Conference_Location :
Albuquerque, NM
Print_ISBN :
978-1-4244-0916-7
Type :
conf
DOI :
10.1109/PAC.2007.4441060
Filename :
4441060
Link To Document :
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