DocumentCode :
2897682
Title :
Why focus on building-in reliability
Author :
Vasquez, Barbara
Author_Institution :
Motorola
fYear :
1992
fDate :
25-28 Oct. 1992
Firstpage :
38
Lastpage :
43
Keywords :
Assembly; Costs; Food manufacturing; Integrated circuit testing; Materials reliability; Packaging; Product development; Qualifications; Research and development; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location :
Lake Tahoe, CA, USA
Type :
conf
DOI :
10.1109/IWLR.1992.657982
Filename :
657982
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2897682
