Title :
Uniformity of field emission electron beam and picosecond field emission from metallic field emitter arrays under high electric field
Author :
Tsujino, Soichiro ; Paraliev, Martin ; Kirk, Eugenie ; Braun, Hans-H
Author_Institution :
Lab. for Micro- & Nanotechnol. & SwissFEL, Paul Scherrer Inst., Villigen, Switzerland
Abstract :
Field-emission characteristics and evolution of beam profile under noble-gas conditioning were studied for a metallic field emitter array cathode using a dc-gun teststand. Whereas dc conditioning procedure resulted in a granular beam, improvement of the beam-uniformity by in-situ conditioning procedure using Ne-gas was demonstrated.
Keywords :
cathodes; electric fields; electron beams; electron guns; field emitter arrays; Ne; beam profile evolution; beam-uniformity; dc conditioning; dc-gun teststand; electric field; field emission electron beam; field-emission characteristics; granular beam; metallic field emitter array cathode; neon gas; noble-gas conditioning; picosecond field emission; Cathodes; Electric potential; Field emitter arrays; Kirk field collapse effect; Logic gates; Particle beams; beam uniformity; field emission; field emitter array; high acceleration electric field; pulsed field emission;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4673-0188-6
Electronic_ISBN :
978-1-4673-0187-9
DOI :
10.1109/IVEC.2012.6262103
