• DocumentCode
    2897863
  • Title

    Programmable interconnection technique

  • Author

    Triebwasser, S.

  • Author_Institution
    Watson Research Center, IBM Corp., Yorktown Heights, NY
  • Volume
    IX
  • fYear
    1966
  • fDate
    9-11 Feb. 1966
  • Firstpage
    124
  • Lastpage
    125
  • Keywords
    Circuit testing; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit yield; Logic circuits; Logic design; Logic testing; Minimization; Monolithic integrated circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
  • Conference_Location
    Philadelphia, PA, USA
  • Type

    conf

  • DOI
    10.1109/ISSCC.1966.1157653
  • Filename
    1157653
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2897863