Title :
Programmable interconnection technique
Author_Institution :
Watson Research Center, IBM Corp., Yorktown Heights, NY
Keywords :
Circuit testing; Electronic equipment testing; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit yield; Logic circuits; Logic design; Logic testing; Minimization; Monolithic integrated circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1966 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1966.1157653
