• DocumentCode
    2897878
  • Title

    Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process

  • Author

    Amri, Mohd Syahrin ; Liew, David ; Harun, Fuaida

  • Author_Institution
    Univ. Teknikal Malaysia Melaka, Durian Tunggal, Malaysia
  • fYear
    2010
  • fDate
    Nov. 30 2010-Dec. 2 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.
  • Keywords
    blades; laser materials processing; metallisation; sawing; blade loading; blade selection; chipping free process; diamond grit size; guard ring; infrared camera; laser frequency selection; laser grooving process; mechanical sawing; metallization; narrow saw street; size 60 mum; size 600 mum; slit design; wafer sawing process; wafer technology; zero chipping occurrences; Aluminum; Blades; Diamond-like carbon; Laser applications; Optimization; Sawing; chipping/peeling free; laser grooving; seal ring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
  • Conference_Location
    Melaka
  • ISSN
    1089-8190
  • Print_ISBN
    978-1-4244-8825-4
  • Type

    conf

  • DOI
    10.1109/IEMT.2010.5746667
  • Filename
    5746667