Title :
Experimental study of temperature sensitivity of carrier lifetime and recombination coefficients in GaInNAs SQW lasers
Author :
Pozo, J. ; Ivanov, P. ; Qiu, Y. ; Rorison, J. ; Konttinen, J. ; Saarinen, M. ; Jouhti, T. ; Pessa, M.
Author_Institution :
Dept. of Electron. & Electr. Eng., Bristol Univ., UK
Abstract :
This paper deals with the characterization of the differential carrier lifetime and the calculation of the monomolecular, radiative and non-radiative recombination coefficients and their temperature dependence as an evidence of the excellent temperature performance of this material system. The device characterized is a 1.25 μm GaInNAs laser structure grown on a GaAs substrate. The active region consists of a single 6 nm thick single quantum well. Light current (L-I) characteristics performed over a temperature range of 20°C to 80°C, show a characteristic temperature of 50 K. Similar than in the case of commercial InGaAs. Good temperature performance of optical gain using Hakki-Paoli method, lasing wavelength and efficiency will also be presented and compared with modelling work.
Keywords :
III-V semiconductors; carrier density; carrier lifetime; electron-hole recombination; gallium arsenide; indium compounds; quantum well lasers; semiconductor growth; 1.25 micron; 20 to 80 C; 50 K; 6 nm; GaAs; GaAs substrate; GaInNAs; GaInNAs single quantum well laser; Hakki-Paoli method; differential carrier lifetime; light current characteristics; monomolecular recombination coefficient; nonradiative recombination coefficient; optical gain; radiative recombination coefficient; recombination coefficient; temperature sensitivity; Charge carrier lifetime; Gallium arsenide; Indium gallium arsenide; Optical materials; Optical sensors; Quantum well lasers; Radiative recombination; Temperature dependence; Temperature distribution; Temperature sensors;
Conference_Titel :
Lasers and Electro-Optics Europe, 2005. CLEO/Europe. 2005 Conference on
Print_ISBN :
0-7803-8974-3
DOI :
10.1109/CLEOE.2005.1568087