Title :
A wide dynamic range CMOS image sensor based on a new gamma correction technique
Author :
Yeonseong Hwang ; Jangwoo Lee ; Daeyun Kim ; Minkyu Song
Author_Institution :
Dept. Semicond. Sci., Dongguk Univ., Seoul, South Korea
Abstract :
Many kinds of wide dynamic range (WDR) CMOS Image Sensors (CIS) have been developed, such as a multiple sampling, a multiple exposure technique, and so on. However, those techniques have some drawbacks of noise increasing, large power consumption, and huge chip area. In this paper, a new Single-Slope ADC (SS-ADC) for gamma correction with a nonlinear counter is described. Since the proposed scheme is easily implemented with a simple algorithm, we can reduce power consumption and chip area drastically. Further, the new SS-ADC for gamma correction enhances the Dynamic Range (DR) by 24dB. The proposed ADC, which has been fabricated using a 0.13um CIS process, achieves a 57.6dB SNDR at 50kS/s.
Keywords :
CMOS image sensors; analogue-digital conversion; CIS process; chip area reduction; gamma correction; nonlinear counter; power consumption reduction; single-slope ADC; size 0.13 mum; wide dynamic range CMOS image sensor; CMOS image sensors; CMOS process; Dynamic range; Object recognition; Power demand; Radiation detectors; Random access memory; CMOS image sensor; Gamma correction ADC; single-slope ADC; wide dynamic range;
Conference_Titel :
SoC Design Conference (ISOCC), 2012 International
Conference_Location :
Jeju Island
Print_ISBN :
978-1-4673-2989-7
Electronic_ISBN :
978-1-4673-2988-0
DOI :
10.1109/ISOCC.2012.6407057