Title :
A 4-Bits Trimmed CMOS Bandgap Reference with an Improved Matching Modeling Design
Author :
Brito, Juan Pablo Martinez ; Bampi, Sergio ; Klimach, Hamilton
Author_Institution :
Graduate Program on Microelectron., Fed. Univ. of Rio Grande do Sul, Porto Alegre
Abstract :
Component tolerances and mismatches due to process variations severely degrade the performance of bandgap reference (BGR) circuits. In this paper, the authors describe the design of a BGR considering the Pelgrom´s mismatch model. The main purpose of our methodology is to convey the design to reach a good trade-off between area and mismatch. Implemented in standard 0.35mum CMOS technology, the circuit also includes a straightforward 4-bits trimming circuit to achieve more process variations independence. Its Monte Carlo temperature coefficient average is 40-ppm/degC and the reference output voltage average is 1.230V. The area of the BGR is 400x350mum2 due to our design matching requirements.
Keywords :
CMOS integrated circuits; reference circuits; 0.35 micron; 1.230 V; 4 bit; CMOS bandgap references; Monte Carlo temperature coefficient; trimming circuit; CMOS process; CMOS technology; Circuits; Degradation; Microelectronics; Monte Carlo methods; Photonic band gap; Semiconductor device modeling; Temperature; Voltage; CMOS Bandgap References; MOSFET Mismatch Modeling; Process Variations; Trimming Circuit;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378348
