• DocumentCode
    2898317
  • Title

    On the Linearization of MOSFET Capacitors

  • Author

    Danaie, Mohammad ; Aminzadeh, Hamed ; Naseh, Sasan

  • Author_Institution
    Comput. & Commun. Res. Center, Ferdowsi Univ. of Mashhad
  • fYear
    2007
  • fDate
    27-30 May 2007
  • Firstpage
    1943
  • Lastpage
    1946
  • Abstract
    In this paper, a heuristic methodology for design of highly linear MOSFET capacitors (MOSCAPs) has been presented. For a certain amount of accessible chip area, the proposed algorithm intends to find the structure which has the least C-V variation. It uses a modified version of the genetic programming to optimize the capacitor topology and transistors´ dimensions. To test the performance of the algorithm, it was utilized for obtaining a highly linear 1 pF capacitor, i.e. with less than 3% variation of capacitance versus 1 V variation across the MOSCAP structure terminals, in a commercial 0.18 mum standard digital CMOS technology. This level of linearity can be otherwise achieved only with MIM capacitors, which are not available in digital CMOS processes.
  • Keywords
    CMOS integrated circuits; MOS capacitors; MOSFET; genetic algorithms; linearisation techniques; technology CAD (electronics); 1 V; 1 pF; CAD tool; CMOS technology; MIM capacitors; MOSFET capacitors; genetic programming; CMOS technology; Capacitance; Capacitance-voltage characteristics; Design methodology; Genetic programming; Linearity; MIM capacitors; MOSFET circuits; Testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Print_ISBN
    1-4244-0920-9
  • Electronic_ISBN
    1-4244-0921-7
  • Type

    conf

  • DOI
    10.1109/ISCAS.2007.378356
  • Filename
    4253045