DocumentCode
2898542
Title
The very first Strain Range Bound Guidance methodology for system board shock evaluation
Author
Chin, Ian ; Wong, Shaw Fong ; Chua Shiau Chin
Author_Institution
Intel Technol. Sdn. Bhd., Kulim, Malaysia
fYear
2010
fDate
Nov. 30 2010-Dec. 2 2010
Firstpage
1
Lastpage
8
Abstract
The wide varieties of system board designs and form factors in the market make electronic package mechanical shock assessments extremely complicated and challenging. The very first strain range guidance methodology presented in this paper attempts to simplify this. This methodology is achieved by establishing a safe limit for the package in both system and component level shock test environments, then integrating them into a single range guide. In this paper, details of both types of board level setups and test conditions are presented along with test results which include strain outputs, bend modes, strain states, together with conclusive failure analysis. For system boards, different board sizes, layouts, heat sinks are assessed and compared. The outcome is a simple strain guide that has been successfully demonstrated. Additionally, the scope of this paper also includes some key learning from the tests and impact of various design attributes on shock performance.
Keywords
failure analysis; heat sinks; packaging; printed circuit layout; bend mode; board size assessment; conclusive failure analysis; electronic package mechanical shock assessment; form factor; heat sink assessment; layout assessment; strain output; strain range bound guidance methodology; strain state; system board design; system board shock evaluation; Acceleration; Computers; Failure analysis; Joints; Loading; Robustness; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
Conference_Location
Melaka
ISSN
1089-8190
Print_ISBN
978-1-4244-8825-4
Type
conf
DOI
10.1109/IEMT.2010.5746699
Filename
5746699
Link To Document