DocumentCode
28986
Title
Measurement of Linewidth Enhancement Factor for 1.3-
InAs/GaAs Quantum Dot Lasers
Author
Jin-Long Xiao ; Chu-Cai Guo ; Hai-Ming Ji ; Peng-Fei Xu ; Qi-Feng Yao ; Xiao-Meng Lv ; Ling-Xiu Zou ; Heng Long ; Tao Yang ; Yong-Zhen Huang
Author_Institution
State Key Lab. on Integrated Optoelectron., Inst. of Semicond., Beijing, China
Volume
25
Issue
5
fYear
2013
fDate
1-Mar-13
Firstpage
488
Lastpage
491
Abstract
We present a procedure for determining the linewidth enhancement factor (α factor) of semiconductor lasers under continuous-wave operation with a proper correction of thermal effects. Gain spectra are measured by the Fourier series expansion method, and the variations of refractive index are determined by the mode wavelength shift and Kramers-Kronig relation, respectively. The α factors are measured in a wide wavelength range from 1170 to 1320 nm for an InAs/GaAs quantum dot (QD) laser with a cavity length of 440 μm. The α factors of 0.42 and 0.79 are obtained at gain peak wavelength of 1210 nm for the excited state at the injection currents of 40 and 60 mA, and the corresponding values of 1.97 and 3.97 are obtained at a wavelength of 1285 nm, respectively. The results show a relative low α factor at the gain peak position of QD excited state. We also calculate theoretically the optical gain and α factor for the QD laser, and compare with the experimental results. The results indicate that high injection current will result in higher α factor due to the appearance of asymmetry gain spectrum.
Keywords
Fourier series; III-V semiconductors; Kramers-Kronig relations; excited states; gallium arsenide; indium compounds; quantum dot lasers; refractive index; spectral line breadth; Fourier series expansion method; InAs-GaAs; Kramers-Kronig relation; continuous wave operation; current 40 mA to 60 mA; excited state; gain spectra; linewidth enhancement factor; mode wavelength shift; quantum dot lasers; refractive index; semiconductor lasers; size 440 mum; thermal effect; wavelength 1.3 mum; wavelength 1170 nm to 1320 nm; wavelength 1210 nm; Current measurement; Measurement by laser beam; Quantum dot lasers; Semiconductor device measurement; Temperature measurement; Wavelength measurement; InAs/GaAs; linewidth enhance factor; quantum dot (QD);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2243136
Filename
6420872
Link To Document