DocumentCode
2898672
Title
Study of the effect of surface roughness and skin depth on the conductivity of metals at 650 GHz
Author
Kirley, Matt P. ; Carlsson, Nils ; Yang, Benjamin B. ; Booske, John H.
Author_Institution
ECE Dept., Univ. of Wisconsin-Madison, Madison, WI, USA
fYear
2012
fDate
24-26 April 2012
Firstpage
239
Lastpage
240
Abstract
A high-quality-factor quasi-optical resonator operating at 650 GHz is used to measure the conductivity of mechanically roughened metal surfaces. The results explore the effective conductivity of metals in the terahertz regime when the surface roughness is on the order of the skin depth.
Keywords
electrical conductivity measurement; resonators; submillimetre wave measurement; surface roughness; conductivity measurement; frequency 650 GHz; high-quality-factor quasi-optical resonator; mechanically roughened metal surfaces; metal conductivity; skin depth; surface roughness effect; Conductivity; Metals; Rough surfaces; Skin; Surface impedance; Surface roughness; Surface topography; THz; conductivity; skin depth; surface roughness; vacuum electronics;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2012 IEEE Thirteenth International
Conference_Location
Monterey, CA
Print_ISBN
978-1-4673-0188-6
Electronic_ISBN
978-1-4673-0187-9
Type
conf
DOI
10.1109/IVEC.2012.6262147
Filename
6262147
Link To Document