On the optical and electrical noise cross-correlation measurements for quality evaluation of laser diodes

In this paper, we report results on investigation of low-frequency optical and electrical noise spectra, as well as relative intensity noise (RIN), and their relation to the optical characteristics in a series of 1.55-μm multiquantum-well strained-layer (SL) and buried-heterostructure (BH) DFB lasers subjected by an accelerated degradation procedure. We demonstrate the advantages of the use of the cross-spectra of low-frequency optical and electrical noise for quality and reliability evaluation of 1.55 μm laser diodes. It is shown that optical and electrical noise correlation factor k is more sensitive for the lasers quality than noise intensity.