Title :
CSI-aided Demapping of Dual-Carrier Modulation for Multiband-OFDM
Author :
Park, Sungchung ; Kim, Yun-Young ; Noh, Jae-Ho ; Kong, Jun-Jin
Author_Institution :
Samsung Adv. Inst. of Technol., Yongin
Abstract :
A novel CSI-aided demapping method for dual-carrier modulation (DCM) is proposed for multiband-OFDM systems. The proposed method utilizes the channel state information (CSI) to calculate the soft decision values, which are given by the approximate log-likelihood ratio (LLR). In this paper, it is shown that the soft decision values are given as the differences between two squared Euclidean distances. By reducing the noise-amplifying effect, the proposed method improves the error performance of conventional methods, by a signal-to-noise-ratio (SNR) of 3dB in the presence of channel estimation error and quantization noise. The VLSI architecture suitable for this method is also proposed, verifying that the performance gain comes with a slight increase of hardware complexity.
Keywords :
OFDM modulation; VLSI; channel estimation; quantisation (signal); CSI-aided demapping; Euclidean distances; VLSI architecture; channel estimation error; channel state information; dual-carrier modulation; hardware complexity; log-likelihood ratio; multiband-OFDM; quantization noise; soft decision values; Channel estimation; Channel state information; Frequency diversity; Hardware; Maximum likelihood decoding; Noise reduction; OFDM modulation; Signal to noise ratio; Vectors; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on
Conference_Location :
New Orleans, LA
Print_ISBN :
1-4244-0920-9
Electronic_ISBN :
1-4244-0921-7
DOI :
10.1109/ISCAS.2007.378510