DocumentCode :
2899043
Title :
Wafer to wafer LED test & scanning back end semiconductor handler
Author :
Thierry, Erne ; Massimo, Scarpella
Author_Institution :
Ismeca Semicond. S.A, La Chaux-de-Fonds, Switzerland
fYear :
2010
fDate :
Nov. 30 2010-Dec. 2 2010
Firstpage :
1
Lastpage :
3
Abstract :
LED WtW platform (world LED fastest wafer rebuilt platform with unique foil to foil process) LED handling, for category sorting and binning, has become a standard process for regular non-fragile LED packages. However, with the constant evolution of this market, new fragile components with ceramic packages, silicon lenses or exotic shape, can not use a regular bulk handling process anymore. Ismeca Semiconductor brought this year a unique foil to foil handling solution for this type of devices. The equipment accommodates an automatic quality vision inspection and singulated unit opto-electrical test processes from an origin foil wafer (up to 12"), to rebuilt a mapped output foil wafer (up to 8"). The output foil is automatically bar code and data matrix printed on the machine to be traceable with its mapping and avoid any operator mishandling. This entire process occurs at the speed of 18\´000 UPH with 0 ppm package damages. The so-called NX WtW, THE world unique LED foil to foil test & scan platform.
Keywords :
ceramic packaging; foils; inspection; light emitting diodes; materials handling; semiconductor device packaging; semiconductor device testing; Ismeca semiconductor; LED WtW platform; LED handling; automatic quality vision inspection; back end semiconductor handler scanning; bar code; bulk handling process; ceramic package; data matrix; foil to foil handling solution; foil wafer; nonfragile LED package; optoelectrical test process; silicon lense; wafer to wafer LED test; Automatic optical inspection; Light emitting diodes; Materials; Sawing; Sorting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
Conference_Location :
Melaka
ISSN :
1089-8190
Print_ISBN :
978-1-4244-8825-4
Type :
conf
DOI :
10.1109/IEMT.2010.5746726
Filename :
5746726
Link To Document :
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