• DocumentCode
    2899104
  • Title

    High-frequency Test Structures For Wafer-level Reliability

  • Author

    Snyder, Eric S. ; Campbell, David V. ; Swanson, Scot E.

  • Author_Institution
    Sandia National Laboratories
  • fYear
    1992
  • fDate
    25-28 Oct. 1992
  • Firstpage
    88
  • Lastpage
    91
  • Keywords
    Automatic testing; Circuit testing; Electric breakdown; Electromigration; Frequency; Hot carriers; Integrated circuit reliability; Stress; System testing; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
  • Conference_Location
    Lake Tahoe, CA, USA
  • Type

    conf

  • DOI
    10.1109/IWLR.1992.657989
  • Filename
    657989
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2899104