DocumentCode :
2899104
Title :
High-frequency Test Structures For Wafer-level Reliability
Author :
Snyder, Eric S. ; Campbell, David V. ; Swanson, Scot E.
Author_Institution :
Sandia National Laboratories
fYear :
1992
fDate :
25-28 Oct. 1992
Firstpage :
88
Lastpage :
91
Keywords :
Automatic testing; Circuit testing; Electric breakdown; Electromigration; Frequency; Hot carriers; Integrated circuit reliability; Stress; System testing; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Level Reliability Workshop, 1992. Final Report., 1992 International
Conference_Location :
Lake Tahoe, CA, USA
Type :
conf
DOI :
10.1109/IWLR.1992.657989
Filename :
657989
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2899104
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