DocumentCode
2899231
Title
Research of the field emission of fractal blades patterns of large length
Author
Gulyaev, Yu.V. ; Koro, V.N. ; Grigorev, Yu A. ; Rehen, G.A.
Author_Institution
Dept. of Saratov, Inst. of Radio Eng. & Electron. of RAS, Saratov, Russia
fYear
2004
fDate
6-10 Sept. 2004
Firstpage
78
Lastpage
80
Abstract
The looking up of effective, cost-effective (cold) sources of intensive beam couplings is one of actual problems of modern vacuum micro- and nanoelectronics. As far as it is known, the difficulties of deriving of large absolute values of a current of field emission are connected to extremely small values of the effective area of emission component, which forms 10-6 to 10-8 part from the area of a cathodic substrate. One of methods of increasing of the effective area of emission is the transferring from regular bivariate tips of gratings to surface patterns blade or planar-end configuration with extended fractal boundaries. Apparently, that substantial surface micro- and nanostructure from this or that fraction can be referred to natural fractals. As it was shown, field emission properties of close set film and monolithic carbon patterns on conductive substrates can be essentially improved by a simple vacuum discharge converting 2D pattern with mean values of a period 65-70 nm, altitude 7-8 nm, and radius of curvature of tops 2-3 nm, in discontinuous branching.
Keywords
cathodes; field emission; fractals; substrates; vacuum microelectronics; 2 to 3 nm; 65 to 70 nm; beam couplings; cathodic substrate; close set film; conductive substrates; cost-effective cold sources; discontinuous branching; field emission; fractal blades patterns; monolithic carbon patterns; natural fractals; surface patterns blade; vacuum discharge; vacuum microelectronics; vacuum nanoelectronics; Blades; Carbon dioxide; Diodes; Fractals; Gratings; Modems; Optical coupling; Substrates; Surface discharges; Vacuum breakdown;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electron Sources Conference, 2004. Proceedings. IVESC 2004. The 5th International
Print_ISBN
0-7803-8437-7
Type
conf
DOI
10.1109/IVESC.2004.1414140
Filename
1414140
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