Abstract :
The following topics are dealt with: semiconductor material noise modelling; semiconductor device noise modelling; oscillator noise; biophysical system; financial system; noise in diodes; thermal noise processing; noise in FinFET; mesoscopic device; noise theory; noise in HEMT; RTS noise; optical device; measurement technique; nanodevice noise and reliability.
Keywords :
biological techniques; circuit noise; diffusion; field effect transistors; mesoscopic systems; optical communication equipment; semiconductor device measurement; semiconductor device noise; semiconductor device reliability; semiconductor diodes; FinFET noise; HEMT noise; RTS noise; biophysical system; financial system; measurement technique; mesoscopic device; nanodevice noise; noise theory; optical device; oscillator noise; semiconductor device noise modelling; semiconductor material noise modelling; thermal noise processing;
Conference_Titel :
Noise and Fluctuations (ICNF), 2011 21st International Conference on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4577-0189-4
DOI :
10.1109/ICNF.2011.5994269
