DocumentCode :
2899616
Title :
A new and simple test structure for evaluating the sectional photo-sensitivity distribution of pixels in a frame-transfer CCD image sensor
Author :
Okigawa, Mitsuru
Author_Institution :
Sanyo Electric Co. Ltd., Gifu, Japan
fYear :
1992
fDate :
16-19 Mar 1992
Firstpage :
134
Lastpage :
138
Abstract :
A metallic optical shield membrane with a rectangular grid of small apertures was formed on the imaging area of a solid-state frame transfer charge-coupled device (CCD) image sensor. This allowed evaluation of a single pixel. The optical apertures were considerably smaller than a single pixel, with the interval between apertures slightly larger than the spacing between pixels. Thus, each pixel has light impinging on only a very small portion on its surface. With a suitable choice of aperture spacing, the output of the CCD directly represents the sensitivity distribution of pixels in the CCD. The sensitivity distribution can be visualized by displaying the CCD output on a cathode-ray-tube monitor. The evaluation of pixel sensitivity distribution is valuable when designing CCD imaging elements
Keywords :
CCD image sensors; aperture spacing; cathode-ray-tube monitor; frame-transfer CCD image sensor; imaging area; imaging elements; metallic optical shield membrane; optical apertures; rectangular grid; sectional photo-sensitivity distribution; sensitivity distribution; solid-state frame transfer charge-coupled device; test structure; Apertures; Biomembranes; Charge coupled devices; Image sensors; Optical devices; Optical imaging; Optical sensors; Solid state circuits; Testing; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures, 1992. ICMTS 1992. Proceedings of the 1992 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-0535-3
Type :
conf
DOI :
10.1109/ICMTS.1992.185955
Filename :
185955
Link To Document :
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