DocumentCode :
2899909
Title :
Advanced copper wire bonding technology
Author :
Hong Meng Ho
Author_Institution :
Semicon Fine Wire Pte Ltd., Singapore, Singapore
fYear :
2010
fDate :
Nov. 30 2010-Dec. 2 2010
Firstpage :
1
Lastpage :
2
Abstract :
Wire bonding is the most dominant form of first-level chip interconnects in microelectronics with gold wire bonding taking the lead for the past few decades. Today, it is evident that the shift from gold to copper wire bonding is genuinely picking up, due to both a surge in gold prices and recent developments in copper wire bonding technology. The course will be divided into two main sections:-1. The first section would discuss the technology trends, the building blocks for copper wire bonding, the key process factors to achieve a reliable copper wire bond and what are the implementation challenges with downstream processes such as interaction with mold compound and its package reliability aspects. 2. The second section would discuss the recent developments in equipment, copper wire material and capillary and how these help realize copper wire bonding in production implementation and how the gaps between gold and copper wire bonding are shorten.
Keywords :
copper; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; lead bonding; Cu; building blocks; copper wire bonding technology; first level chip interconnects; package reliability; technology trends; Bonding; Copper; Surges; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium (IEMT), 2010 34th IEEE/CPMT International
Conference_Location :
Melaka
ISSN :
1089-8190
Print_ISBN :
978-1-4244-8825-4
Type :
conf
DOI :
10.1109/IEMT.2010.5746772
Filename :
5746772
Link To Document :
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