• DocumentCode
    2899980
  • Title

    Enhancing DME/N multipath rejection with tightened pulse waveform variation

  • Author

    Euiho Kim

  • Author_Institution
    SELEX Syst. Integration Inc., Overland Park, KS, USA
  • fYear
    2013
  • fDate
    5-10 Oct. 2013
  • Abstract
    This paper presents a methodology to suppress Distance Measuring Equipment (DME or DME/N) multipath using supervised learning and tightened DME pulse waveform variation. The current DME specifications allow relatively large variation in the DME pulse waveform in both of the interrogator and transponder. The allowed variation in the waveform makes it difficult to discern if the received signal is direct or deformed from added multipath. Therefore, the range of the allowed variation in the pulse shape needs to be tightened and that would facilitate multipath rejection using various algorithms. This paper applies a supervised learning technique to develop a time of arrival error estimator that compensates for the multipath impacts on the DME range measurements. The learning process utilizes the training data consisting of the numerous deformed DME pulse waveforms and the corresponding time of arrival errors. Considerable noise is also included in the training data such that the estimator behaves robustly in various situations. The theory behind and performance of supervised learning on the DME multipath problem are presented in this paper.
  • Keywords
    computerised instrumentation; distance measurement; error analysis; learning (artificial intelligence); time-of-arrival estimation; transponders; DME range measurements; DME/N multipath rejection; distance measuring equipment; interrogator; multipath impact compensation; noise; pulse shape; supervised learning; tightened DME pulse waveform variation; time of arrival error estimator; transponder; Accuracy; Data models; Equations; Shape; Supervised learning; Training data; Transponders;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital Avionics Systems Conference (DASC), 2013 IEEE/AIAA 32nd
  • Conference_Location
    East Syracuse, NY
  • ISSN
    2155-7195
  • Print_ISBN
    978-1-4799-1536-1
  • Type

    conf

  • DOI
    10.1109/DASC.2013.6712590
  • Filename
    6712590